Concurrent delamination propagation and deformation localization in semiconductor devices
Publication information:
499, Shawn R. Lavoie, Guodong Nian, Chen-Wei Li, Jason Lan, Yu-Sheng Lin, Yi-Lun Lin, Sherwin Tang, Jyun-Lin Wu, Joost J. Vlassak, and Zhigang Suo. 2024. “ Concurrent Delamination Propagation and Deformation Localization in Semiconductor Devices ”. Mechanics of Materials