Initiation and arrest of cracks from corners in multi-chip semiconductor devices
Publication information:
500, Guodong Nian, Yu-Sheng Lin, Jia-Ming Yang, Sammy Hassan, Jyun-Lin Wu, Sherwin Tang, Jun He, Joost J. Vlassak, and Zhigang Suo. 2024. “ Initiation and Arrest of Cracks from Corners in Multi-Chip Semiconductor Devices ”. Journal of the Mechanics and Physics of Solids, 191