The Thickness and Stretch Dependence of the electrical breakdown strength of dielectric elastomers
Publication information:
294, Jiangshui Huang, Samuel Shian, Roger M. Diebold, Zhigang Suo, and David R. Clarke. 2012. “The Thickness and Stretch Dependence of the Electrical Breakdown Strength of Dielectric Elastomers”. Applied Physics Letters, 101, Pp. 122905